Cadmium Zinc Telluride is the best choice for IR detectors cutting-edge. Stanford Optics has rich experience in manufacturing and supplying high-quality Optical Products.
Cadmium Zinc Telluride (CZT) Wafer is made from an alloy consisting of Cd, Zn, and Te. Because of Cd and Te’s high atomic numbers, CZT has a high sensitivity for X-rays and gamma rays. CZT Wafers have excellent electrical properties and high absorption coefficients. Due to its high IR transmission, CZT Wafer is the best choice for IR detectors cutting-edge. CZT is a new material and there will be more areas to use CZT as CZT develops and improves.
Purity |
6N, 7N |
Size |
10*10mm to 20*20mm (larger size needs to ask) |
Band Gap |
1.4~2.2eV |
Orientation |
<111> <211> |
Electrical Resistivity(300K) |
>106Ω*cm |
IR Transmission |
≥60% |
X-ray DCRC FWHM(FWHM) |
≤30rad*s |
Type |
p-type |
Surface Roughness |
Ra< 0.5nm |
Thickness |
1~1.3mm |
Used in electronic devices such as gamma-ray detectors, X-ray detectors, and radiation detectors.
Used in infrared (IR) thin-film epitaxy substrate.
Used in medical imaging and nuclear medicine.
Our Cadmium Zinc Telluride (CZT) Wafer is carefully handled during storage and transportation to preserve the quality of our product in its original condition.
Purity |
6N, 7N |
Size |
10*10mm to 20*20mm (larger size needs to ask) |
Band Gap |
1.4~2.2eV |
Orientation |
<111> <211> |
Electrical Resistivity(300K) |
>106Ω*cm |
IR Transmission |
≥60% |
X-ray DCRC FWHM(FWHM) |
≤30rad*s |
Type |
p-type |
Surface Roughness |
Ra< 0.5nm |
Thickness |
1~1.3mm |
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